DocumentCode :
2318676
Title :
Understanding the residual waveguide interface variations on millimeter wave calibration
Author :
Lau, Yuenie
Author_Institution :
OML, Inc., Morgan Hill, CA, USA
fYear :
2010
fDate :
Nov. 30 2010-Dec. 3 2010
Firstpage :
1
Lastpage :
14
Abstract :
Calibration is essential in obtaining accurate Vector Network Analyzer (VNA) measurements. Often, it is taken for granted that millimeter wave waveguide calibration is a simple, straightforward process as those in the RF & microwave waveguide calibration or in the coaxial calibration. This paper provides a better understanding of the “residual” or “non-ideal” waveguide aperture interface that often obfuscates a valid, repeatable, Thru-Reft-Line (TRL) and/or Line-Reft-Line (LRL) calibration of a two-port waveguide millimeter wave VNA system. WR05 and WR03 waveguide band data are presented.
Keywords :
calibration; millimetre waves; network analysers; waveguides; RF waveguide calibration; VNA measurements; WR03 waveguide band data; WR05 waveguide band data; coaxial calibration; line-reft-line calibration; microwave waveguide calibration; millimeter wave waveguide calibration; nonideal waveguide aperture interface; residual waveguide interface variations; thru-reft-line calibration; two-port waveguide millimeter wave VNA system; vector network analyzer measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG
Conference_Location :
Clearwater Beach, FL
Print_ISBN :
978-1-4244-7447-9
Type :
conf
DOI :
10.1109/ARFTG76.2010.5700066
Filename :
5700066
Link To Document :
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