• DocumentCode
    2318709
  • Title

    Terahertz generation in negative-effective-mass diodes

  • Author

    Cao, J.C. ; Liu, H.C. ; Feng, S.L.

  • Author_Institution
    State Key Lab. of Functional Mater. for Informatics, Chinese Acad. of Sci., Shanghai, China
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    143
  • Lastpage
    146
  • Abstract
    Theoretically studied current self-oscillations and spatiotemporal current patterns in quantum-well (QW) negative-effective-mass (NEM) p+pp+ diodes when the electric field is applied along the direction of the well. The origin of current self-oscillations is the formation and traveling of electric-field domains in the well. In the calculations we have accurately considered scattering contributions from carrier-impurity, carrier-acoustic phonon, and carrier-optic phonon. It is indicated that, both the applied bias and the doping concentration in the well largely influence the current patterns and self-oscillating frequencies, which lie in the THz range for the NEM p+pp+ diode having a submicrometer p-base. The NEM p+pp+ diode presented here may therefore be used as an electrically tunable THz source.
  • Keywords
    doping profiles; effective mass; quantum well devices; submillimetre wave diodes; submillimetre wave generation; applied bias; carrier-acoustic phonon; carrier-impurity; carrier-optic phonon; current patterns; current self-oscillations; doping concentration; electric-field domains; electrically tunable terahertz source; negative-effective-mass diodes; p+pp+ diodes; quantum-well diodes; scattering contributions; self-oscillating frequencies; spatiotemporal current patterns; submicrometer p-base; terahertz generation; Dispersion; Doping; Effective mass; Equations; Light scattering; Optical scattering; Phonons; Semiconductor diodes; Spatiotemporal phenomena; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Terahertz Electronics Proceedings, 2002. IEEE Tenth International Conference on
  • Print_ISBN
    0-7803-7630-7
  • Type

    conf

  • DOI
    10.1109/THZ.2002.1037612
  • Filename
    1037612