DocumentCode
2318844
Title
Fabrication of gated nanosize Si-tip arrays for high perveance electron beam applications
Author
Lim, Sung-Hyun ; Jung, M.Y. ; Kim, D.W. ; Choi, Seong Sloo ; Jeon, H.
Author_Institution
Dept. of Phys., Sun Moon Univ., Ahsan, South Korea
fYear
1998
fDate
19-24 July 1998
Firstpage
119
Abstract
Summary form only given. Nanosize Si-tip arrays with gated electrodes have been fabricated using self-aligned method. In order to have parallel electron beam (high perveance beam) toward the anode plate, we have designed a nanosize tip array with heights of the tip slightly less than that of a gate electrode. High perveance beam is supposed to provide a better focusing of electron beams. Hence, it is important to have a high perveance electron beam for nano lithographic application.
Keywords
electron beam focusing; electron field emission; elemental semiconductors; nanotechnology; silicon; vacuum microelectronics; Si; electron beam focusing; fabrication; gated electrode; nanosize Si tip field emission array; perveance; self-aligned method; Anodes; Apertures; Electrodes; Electron beam applications; Electron beams; Fabrication; Moon; Physics; Sputter etching; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location
Asheville, NC, USA
Print_ISBN
0-7803-5096-0
Type
conf
DOI
10.1109/IVMC.1998.728670
Filename
728670
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