• DocumentCode
    2318844
  • Title

    Fabrication of gated nanosize Si-tip arrays for high perveance electron beam applications

  • Author

    Lim, Sung-Hyun ; Jung, M.Y. ; Kim, D.W. ; Choi, Seong Sloo ; Jeon, H.

  • Author_Institution
    Dept. of Phys., Sun Moon Univ., Ahsan, South Korea
  • fYear
    1998
  • fDate
    19-24 July 1998
  • Firstpage
    119
  • Abstract
    Summary form only given. Nanosize Si-tip arrays with gated electrodes have been fabricated using self-aligned method. In order to have parallel electron beam (high perveance beam) toward the anode plate, we have designed a nanosize tip array with heights of the tip slightly less than that of a gate electrode. High perveance beam is supposed to provide a better focusing of electron beams. Hence, it is important to have a high perveance electron beam for nano lithographic application.
  • Keywords
    electron beam focusing; electron field emission; elemental semiconductors; nanotechnology; silicon; vacuum microelectronics; Si; electron beam focusing; fabrication; gated electrode; nanosize Si tip field emission array; perveance; self-aligned method; Anodes; Apertures; Electrodes; Electron beam applications; Electron beams; Fabrication; Moon; Physics; Sputter etching; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1998. Eleventh International
  • Conference_Location
    Asheville, NC, USA
  • Print_ISBN
    0-7803-5096-0
  • Type

    conf

  • DOI
    10.1109/IVMC.1998.728670
  • Filename
    728670