• DocumentCode
    23192
  • Title

    Analysis and modeling of k-regular and k-connected protection structure in ultra-high capacity optical networks

  • Author

    Li Xin ; Huang Shanguo ; Zhang Jie ; Zhao Yongli ; Gu Wanyi ; Wang Yang

  • Author_Institution
    China Electr. Power Res. Inst., Beijing, China
  • Volume
    12
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar. 2015
  • Firstpage
    106
  • Lastpage
    119
  • Abstract
    This paper proposes k-regular and k-connected (k&k) structure against multi-faults in ultra-high capacity optical networks. Theoretical results show that pre-configured k&k structure can reach the lower bound on logical redundancy. The switching time of k&k protection structure is as quickly as ring-based protection in SDH network. It is the optimal protection structure in ultra-high capacity optical networks against multi-faults. We develop the linear programming model for k&k structure and propose a construction method for k&k structure design. Simulations are conducted for spare spectrum resources efficiency of the pre-configured k&k structure under multi-faults on representative COST239 and NSFnet topologies. Numerical results show that the spare spectrum resources efficiency of k&k structure can reach the lower bound on logical redundancy in static networks. And it can largely improve spare spectrum resources efficiency compared with p-cycles based protection structure without reducing protection efficiency under dynamic traffics.
  • Keywords
    linear programming; optical communication; radio spectrum management; dynamic traffics; k-connected protection structure; k-regular protection structure; linear programming model; logical redundancy; spare spectrum resources efficiency; ultra-high capacity optical networks; Bandwidth; Network topology; Optical fiber networks; Optical fibers; Redundancy; k-regular and k-connected structure; multi-faults; ultra-high capacity optical networks;
  • fLanguage
    English
  • Journal_Title
    Communications, China
  • Publisher
    ieee
  • ISSN
    1673-5447
  • Type

    jour

  • DOI
    10.1109/CC.2015.7084369
  • Filename
    7084369