• DocumentCode
    2319206
  • Title

    Phase unwrapping of SAR interferograms after wavelet denoising

  • Author

    Braunisch, Henning ; Wu, Bae-Ian ; Kong, Jin A.

  • Author_Institution
    Res. Lab. of Electron., MIT, Cambridge, MA, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    752
  • Abstract
    Obtaining a digital elevation model (DEM) with the help of synthetic aperture radar (SAR) interferometry requires 2D phase unwrapping known to be sensitive to noise. Especially the existence of local inconsistencies of the data, referred to as residues, slows down the convergence of typical unwrapping algorithms and introduces inaccuracies into the computed results, affecting directly terrain height inversion. This suggests applying the computationally efficient Donoho wavelet denoising technique with the complex interferogram as input, preserving the lines of phase discontinuity (fringes) and yielding filtered images of good visual quality. The authors examine the quantitative effects of this pre-processing
  • Keywords
    geophysical signal processing; geophysical techniques; radar imaging; radar theory; remote sensing by radar; synthetic aperture radar; terrain mapping; topography (Earth); wavelet transforms; 2D phase unwrapping; DEM; Donoho wavelet; SAR interferogram; digital elevation model; filtered image; geophysical measurement technique; interferometry; land surface topography; local inconsistencies; noise; phase discontinuity; phase unwrapping; pre-processing; quantitative effect; radar remote sensing; radar signal processing; residues; synthetic aperture radar; terrain height inversion; terrain mapping; unwrapping algorithm; wavelet denoising; Backscatter; Digital elevation models; Filtering; High-resolution imaging; Laboratories; Microwave filters; Microwave imaging; Noise reduction; Phase noise; Synthetic aperture radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.861692
  • Filename
    861692