• DocumentCode
    2319372
  • Title

    Observation of a new type of field-induced electron emission from a diamond-based heterostructure

  • Author

    Chen, J. ; Deng, S.Z. ; Xu, N.S. ; Wu, K.H. ; Wang, E.G.

  • Author_Institution
    Dept. of Phys., Zhongshan Univ., Guangzhou, China
  • fYear
    1998
  • fDate
    19-24 July 1998
  • Firstpage
    174
  • Lastpage
    175
  • Abstract
    The nitrogen-doped diamond films were deposited on Mo substrates by Microwave Plasma Enhanced CVD using N/sub 2//CH/sub 4/, as feedstock. A two-layer structure consisting of a a-Mo/sub 2/C buffer layer and diamond film was formed. Their field-induced electron emission characteristics, i.e., I-V characteristics and distribution of emission sites were studied using the Transparent Anode Imaging Technique. Repeatable abrupt change of "on" and "off" states of emission was observed at two corresponding specific fields during circling of both increasing and decreasing applied gap field. A plausible explanation is given to this new type of field-induced electron emission phenomenon.
  • Keywords
    diamond; electron field emission; plasma CVD coatings; C:N-Mo/sub 2/C; I-V characteristics; Mo substrate; a-Mo/sub 2/C buffer layer; field-induced electron emission; heterostructure; microwave plasma enhanced CVD; nitrogen-doped diamond film; transparent anode imaging; Anodes; Breakdown voltage; Buffer layers; Electric breakdown; Electron emission; Nitrogen; Nuclear and plasma sciences; Physics; Plasma properties; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1998. Eleventh International
  • Conference_Location
    Asheville, NC, USA
  • Print_ISBN
    0-7803-5096-0
  • Type

    conf

  • DOI
    10.1109/IVMC.1998.728700
  • Filename
    728700