• DocumentCode
    2319719
  • Title

    Apparent mobility and its relationship with ageing in polymeric insulation materials

  • Author

    Chen, Gang ; Van Nguyen, Thuy

  • Author_Institution
    Sch. of Electron. & Comput. Sci., Univ. of Southampton, Southampton
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    633
  • Lastpage
    637
  • Abstract
    Apparent mobility obtained from space charge decay measurement has been recently used as an ageing marker to assess degradation of the insulation materials. The apparent mobility of charge carriers becomes slower after experiencing electrical ageing. In this paper, we have measured space charge decay in polymeric insulation material using the pulsed electroacoustic technique and studied apparent mobility features in a wide range of the applied fields and poling times. It has been found that the increase in the applied field and poling time produces more deep trapped charges, leading to a decrease in apparent mobility with time. For a specific time, the detrapping process is dominated by the charges of specific trap levels, resulting in a time dependent apparent mobility. In addition it has been found a sudden increase in apparent mobility at high fields, indicating that a precaution has to be taken when assessing the ageing using the method.
  • Keywords
    ageing; charge measurement; organic insulating materials; pulsed electroacoustic methods; space charge; apparent mobility; detrapping process; electrical ageing; polymeric insulation materials; pulsed electroacoustic technique; space charge decay measurement; Aging; Charge carriers; Charge measurement; Current measurement; Degradation; Plastic insulation; Polymers; Pulse measurements; Pulsed electroacoustic methods; Space charge; apparent mobility; electrical ageing; high electric field; insulation; polymeric; space charge; trapping characteristic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-1621-9
  • Electronic_ISBN
    978-1-4244-1622-6
  • Type

    conf

  • DOI
    10.1109/CMD.2008.4580366
  • Filename
    4580366