• DocumentCode
    2319867
  • Title

    The effect of atmospheric factor on various test gaps under negative impulse voltages

  • Author

    Chotigo, S. ; Pungsiri, B. ; Kanchana, S.

  • Author_Institution
    Dept. of Electr. Eng., King Mongkut´´s Univ. of Technol. Thonburi, Bangkok
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    667
  • Lastpage
    670
  • Abstract
    This paper dealt with the effect of the atmospheric factors on various test gaps under the standard negative impulse voltage, 1.2/50 mus. The atmospheric factors in this present work were relative humidity, temperature and the ratio of the absolute humidity to the air density correction factor(h/delta). Gaps used were sphere-sphere, rod-plane and rod-rod gaps. The diameter of the sphere was 12.5 cm and the length of the rod was 20 cm. The dimensions of the plane were 4*4 cm2 copper, and 70*70 cm2 steel. The maximum voltage used in this present work was about 230 kV. The results of the breakdown voltage (U50) as a function of atmospheric factors were plotted. All the present data was obtained at the High Voltage Laboratory of King Mongkutpsilas University of Technology Thonburi using a 400 kV 8 kJ impulse voltage generator.
  • Keywords
    air gaps; electric breakdown; flashover; humidity; pulse generators; High Voltage Laboratory; King Mongkutpsilas University of Technology Thonburi; absolute humidity; air density correction factor; atmospheric factor; breakdown voltage; energy 8 kJ; flashover; impulse voltage generator; negative impulse voltages; relative humidity; temperature; test gaps; voltage 400 kV; Air gaps; Breakdown voltage; Circuit testing; Condition monitoring; Copper; Flashover; Humidity; Impulse testing; Steel; Temperature; Negative Impulse Voltage; flashover; humidity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-1621-9
  • Electronic_ISBN
    978-1-4244-1622-6
  • Type

    conf

  • DOI
    10.1109/CMD.2008.4580374
  • Filename
    4580374