DocumentCode :
2319905
Title :
Fault coverage design and analysis tools for fault tolerant systems
Author :
Turconi, Giorgio ; Perna, Ermelinda Di ; Marchetti, Elena ; Valle, Riccardo
Author_Institution :
Italtel Soc. Italiana Telecommun. SpA, Milan, Italy
fYear :
1998
fDate :
7-9 Sep 1998
Firstpage :
276
Abstract :
Complex systems require severe availability objectives related to the importance of the service being provided; for this reason, they are usually fault tolerant. Fault-tolerant designers try to create mechanisms to detect 100% of faults, because in complex systems, uncovered faults lead to latent highly undesired situations. Starting from the basics of FMECA, a design methodology and a tool have been developed (DIANA=Diagnostic ANAlysis). The basic idea of DIANA is to perform coverage analysis during hardware and firmware design together with reliability engineering analysis. To this purpose, DIANA has been integrated into the CAD tools in the same way that logic simulation, timing analysis and analog transmission simulation are performed. Two main results have been obtained by the DIANA project: the first is to provide the designers with a tool that helps them to think in such a way to prevent uncovered fault situations; the second is to calculate the effects of faults on diagnostics in order to provide transition rates to system availability models when real, rather than ideal, cases are taken into account. And we can find the point of diminishing returns
Keywords :
computer testing; fault tolerant computing; CAD; CAD tools; DIANA; Tool Mentor; complex systems; coverage analysis; diagnostic fault; fault tolerant systems; reliability analysis; reliability engineering analysis; uncovered faults; Analytical models; Availability; Design automation; Design methodology; Fault detection; Fault tolerant systems; Hardware; Microprogramming; Performance analysis; Reliability engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Performance and Dependability Symposium, 1998. IPDS '98. Proceedings. IEEE International
Conference_Location :
Durham, NC
ISSN :
1087-2191
Print_ISBN :
0-8186-8679-0
Type :
conf
DOI :
10.1109/IPDS.1998.707735
Filename :
707735
Link To Document :
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