Title :
STM study of diamond films electron field emission
Author :
Rakhimov, A.T. ; Suetin, N.V. ; Soldatov, E.S. ; Timofeyev, M.A. ; Trifonov, A.S. ; Khanin, V.V.
Author_Institution :
Inst. of Nucl. Phys., Moscow State Univ., Russia
Abstract :
It is known, that diamond films have good emission properties. However, some important aspects of this phenomenon remain unexplored. The data about nanoscale structure and properties of the films can help to establish these problems. These data are obtainable by scanning tunneling microscope (STM). The experiment data can help to find a resolution of recognizing the current nature at the different regions of a sample. The aim of this work is to study the morphologic and emission characteristics of these films at the nanoscale.
Keywords :
crystal morphology; diamond; electron field emission; nanostructured materials; scanning tunnelling microscopy; thin films; C; STM; diamond films; electron field emission; emission characteristics; morphology; nanoscale structure; scanning tunneling microscopy; Current measurement; Electron emission; Microscopy; Nuclear physics; Shape; Surface morphology; Surface resistance; Surface topography; Tunneling; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728730
