Title :
Role of defects in field emission from undoped polycrystalline diamond films
Author :
Huang, Qing-An ; Qin, Ming ; Bin Zhang ; Zheng, Qi-Jing
Author_Institution :
Microelectron. Center, Southeast Univ., Nanjing, China
Abstract :
In this paper, role of defects in field emission from the undoped polycrystalline diamond (PCD) films is theoretically studied. Based on the Poole-Frenkel conduction with the overlapping defect centers, a model is presented which suggests that electron transport within the undoped PCD films governs field emission from the undoped PCD films.
Keywords :
Poole-Frenkel effect; diamond; electron field emission; thin films; C; Poole-Frenkel conduction; defects; electron transport; field emission; undoped polycrystalline diamond film; Anodes; Conducting materials; Conductive films; Current density; Electron emission; Microelectronics; Semiconductor films; Substrates; Thermal conductivity; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728738
