DocumentCode :
2320137
Title :
A novel algorithm of dielectric loss measurement based on orthogonal decomposition
Author :
Dapeng, Duan ; Yong, Qian ; Yi, Zeng ; Caixin, Sun ; Xiuchen, Jiang
Author_Institution :
Dept. of Electr. Eng., Shanghai Jiao Tong Univ., Shanghai
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
748
Lastpage :
751
Abstract :
The physical meanings and definition of dielectric loss factor-tandelta was analyzed under the harmonic condition. Voltage and current were defined as vectors in normed linear space. By using the characteristic of orthogonal vector in inner product space, the current signal was decomposed to active and reactive currents. Subsequently, a novel digital algorithm of tandelta measurement, which was defined as ratio of norms of the active current and currents, was presented based on orthogonal decomposition. Lastly, the proposed algorithm was simulated under several conditions. The simulation results show that the proposed algorithm is correct and predominant compared with the harmonic analysis method, and that the algorithm has physical meanings, simple calculation, precise measurement result and strong anti-interference capability.
Keywords :
condition monitoring; dielectric loss measurement; insulation testing; leakage currents; vectors; active currents; antiinterference capability; dielectric loss measurement; digital algorithm; harmonic condition; inner product space; insulation condition evaluation; leakage current signal decomposition; normed linear space; orthogonal decomposition; orthogonal vector; precise measurement; reactive currents; tandelta measurement; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Fluctuations; Frequency; Harmonic analysis; Leakage current; Loss measurement; Power supplies; Voltage; Active Current; Active Power; Coefficient; Dielectric Loss Factor; Digital Measurement; Orthogonal Decomposition; Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-1621-9
Electronic_ISBN :
978-1-4244-1622-6
Type :
conf
DOI :
10.1109/CMD.2008.4580394
Filename :
4580394
Link To Document :
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