Title :
Urban land cover mapping by spatial-spectral feature analysis of high resolution hyperspectral data with decision directed acyclic graph SVM
Author :
Huang, Y. Cheng ; Li, Pingxiang ; Zhang, Liangpei ; Zhong, Y.
Author_Institution :
State Key Lab. of Inf. Eng. in Surveying, Mapping & Remote Sensing, Wuhan Univ., Wuhan, China
Abstract :
Classification and extraction of spatial and spectral features are investigated in urban areas from for high resolution hyperspectral imagery (HHR). The approach consists of two steps. First, the shape expansion and texture features were extracted by PSI and GLCM respectively; and spectral information was expressed by parts-based component feature generated by nonnegative matrix factorization or constrained energy match filter, which is based on mixed spectral. Second, two types of HHR features are classified by directed acyclic graph SVM. We evaluated the proposed approach with three kinds feature set on Pavia DAIS data, and the results show that the spectral and spatial classified in a fusion way by SVM improves both OA and kappa compared to spectral information only; and parts-based component feature with the spectral band also had good results.
Keywords :
feature extraction; geophysics computing; image classification; matched filters; remote sensing; shape recognition; support vector machines; terrain mapping; vegetation; GLCM method; PSI method; Pavia DAIS data; QuikeBird; acyclic graph SVM; feature extraction; gray level co-occurrence matrix; high resolution hyperspectral data; image classificaiton; kappa; match filter; matrix factorization; pixel shape index; remote sensing data; shape expansion; spatial-spectral feature analysis; support vector machines; surface cover mapping; texture feature; urban land cover mapping; Data mining; Energy resolution; Feature extraction; Hyperspectral imaging; Image resolution; Shape; Spatial resolution; Support vector machine classification; Support vector machines; Urban areas;
Conference_Titel :
Urban Remote Sensing Event, 2009 Joint
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3460-2
Electronic_ISBN :
978-1-4244-3461-9
DOI :
10.1109/URS.2009.5137571