Novel measurement methods for in-depth analysis of AC metallized film capacitors

Metallized film capacitors with self-healing properties become increasingly relevant for high voltage power applications due to their high capacitance density, high power density, and inherent safety. However, because of a lack of generic design rules, introduction of new capacitor designs requires time-consuming aging tests. We present a novel toolkit of measurement methods with the purpose of gaining a deeper knowledge on aging mechanisms and decreasing the development time for new capacitor designs.