• DocumentCode
    2320662
  • Title

    Full wave analysis of coplanar phase shifter printed on high purity ferroelectric material

  • Author

    De Flaviis, F.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
  • Volume
    3
  • fYear
    2000
  • fDate
    11-16 June 2000
  • Firstpage
    1367
  • Abstract
    In this paper a detailed analysis of coplanar phase shifters which use ferroelectric material (FEM) as active tuning element is performed, and results are compared with measured data. The phase-shift capability of the FEM results from the fact that the dielectric constant of such a material can be changed under the effect of an electric static bias field. Because of the nonlinear nature of these materials and the tensor property of their dielectric constant, a static analysis is performed to obtain the spatial dependence of the permittivity using an iterative numerical technique. Once the spatial dielectric tensor profile of the material for the specific structure is obtained, a full wave analysis based on a time domain technique is conducted to obtain the return loss and insertion loss of the phase shifter.
  • Keywords
    Coplanar transmission lines; Coplanar waveguide components; Ferroelectric devices; Iterative methods; Losses; Microwave phase shifters; Permittivity; Strip line components; Time-domain analysis; Tuning; UHF phase shifters; Waveguide theory; 1 to 3 GHz; CPW; coplanar phase shifter; dielectric constant; electric static bias field; ferroelectric active tuning element; full wave analysis; high purity ferroelectric material; insertion loss; iterative numerical technique; permittivity; return loss; spatial dependence; static analysis; tensor property; time domain technique; Dielectric constant; Dielectric losses; Dielectric materials; Ferroelectric materials; Insertion loss; Performance analysis; Performance evaluation; Phase change materials; Phase shifters; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest. 2000 IEEE MTT-S International
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-5687-X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2000.861795
  • Filename
    861795