Surface-enhanced photoemission in the Schottky diodes with microrelief interface

Author

Dmitruk, N.L. ; Mamykin, S.V.

Author_Institution

Inst. for Phys. of Semicond., Acad. of Sci., Kyiv, Ukraine

fYear

1998

fDate

19-24 July 1998

Firstpage

310

Lastpage

311

Abstract

Internal electron photoemission at metal/semiconductor interface can be increased by electrostatic field concentrated on the ledges of surface with large curvature. On the other hand the incident light on the interface of two media with different signs of the dielectric constant can excite the surface plasmon-polariton (SPP) wave with several order more amplitude. This dynamic electric field can also assist to electron photoemission. In the case of thin metal film it lead to increase of the electron emission into vacuum. Combining these two ways of electron emission enhancement is the aim of this paper.

Keywords

Schottky diodes; photoemission; polaritons; surface plasmons; Schottky diode; dielectric constant; dynamic electric field; electron emission; electrostatic field; internal electron photoemission; metal/semiconductor interface; microrelief interface; surface plasmon-polariton wave; surface-enhanced photoemission; Absorption; Atomic force microscopy; Electrons; Optical surface waves; Photoelectricity; Rough surfaces; Schottky diodes; Surface roughness; Surface texture; Surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Microelectronics Conference, 1998. Eleventh International

Conference_Location

Asheville, NC, USA

Print_ISBN

0-7803-5096-0

Type

conf

DOI

10.1109/IVMC.1998.728772

Filename

728772