Title :
Surface-enhanced photoemission in the Schottky diodes with microrelief interface
Author :
Dmitruk, N.L. ; Mamykin, S.V.
Author_Institution :
Inst. for Phys. of Semicond., Acad. of Sci., Kyiv, Ukraine
Abstract :
Internal electron photoemission at metal/semiconductor interface can be increased by electrostatic field concentrated on the ledges of surface with large curvature. On the other hand the incident light on the interface of two media with different signs of the dielectric constant can excite the surface plasmon-polariton (SPP) wave with several order more amplitude. This dynamic electric field can also assist to electron photoemission. In the case of thin metal film it lead to increase of the electron emission into vacuum. Combining these two ways of electron emission enhancement is the aim of this paper.
Keywords :
Schottky diodes; photoemission; polaritons; surface plasmons; Schottky diode; dielectric constant; dynamic electric field; electron emission; electrostatic field; internal electron photoemission; metal/semiconductor interface; microrelief interface; surface plasmon-polariton wave; surface-enhanced photoemission; Absorption; Atomic force microscopy; Electrons; Optical surface waves; Photoelectricity; Rough surfaces; Schottky diodes; Surface roughness; Surface texture; Surface waves;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728772
