• DocumentCode
    2320814
  • Title

    In-plan self-organized two-dimensional-ordered GeSi islands grown on Si[001] by molecular beam epitaxy

  • Author

    Peng, C.S. ; Li, Y.K. ; Zhou, J.M.

  • Author_Institution
    Inst. of Phys., Acad. Sinica, Beijing, China
  • fYear
    2002
  • fDate
    15-20 Sept. 2002
  • Firstpage
    55
  • Lastpage
    56
  • Abstract
    The mechanisms that control the self-assembly of coherent, faceted three-dimensional (3D) islands in lattice-mismatched heteroepitaxial systems have been the subject of recent intense interest. For optical applications random arrangement of uniform-size islands is often adequate; however, for most electronic applications, such as single-electron devices, the islands must be positioned at least in one-dimensional ordering, even two-dimensional ordering is needed. We report a new method to grow in-plan 2-dimensional-ordered GeSi islands on Si [001] substrate by using low-temperature (LT) growth technique. The growth was carried out in a VG V80S MBE system.
  • Keywords
    Ge-Si alloys; island structure; molecular beam epitaxial growth; self-assembly; semiconductor epitaxial layers; semiconductor growth; GeSi; Si; Si[001]; lattice-mismatched heteroepitaxial systems; molecular beam epitaxy; self-organized two-dimensional-ordered GeSi islands; Atomic force microscopy; Control systems; Germanium silicon alloys; Molecular beam epitaxial growth; Optical buffering; Optical devices; Physics; Self-assembly; Silicon germanium; Single electron devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Molecular Beam Epitaxy, 2002 International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7581-5
  • Type

    conf

  • DOI
    10.1109/MBE.2002.1037757
  • Filename
    1037757