Investigation of thickness effects on AlN coated metal tips by in situ I-V measurement

The thickness of a deposited coating can be a critical factor in determining the emission characteristics of coated emitters. Several researchers have reported a thickness dependence of emission from emitters coated with wide band gap materials. Thus systematic I-V experiments are required, preferably using a single emitter with deposited layers of varying thickness. In the present study, the thickness effects of ultra thin AlN layers on Mo emitters was investigated using an in situ I-V measurement technique.