Title :
Large-Scale Facilities for R&D on micro- and nanotechnologies: Neutrons and synchrotron X-rays for advanced electronics characterisation
Author :
Beaucour, J. ; Mitchell, E. ; Bordet, P. ; Chabli, A. ; Stirling, W.
Author_Institution :
Inst. Laue-Langevin, Grenoble, France
Abstract :
Large-scale research infrastructures offer unrivalled performance for the advanced characterisation of micro- and nano-electronic devices and systems. However, the access to large-scale facilities permitting this unique advanced characterisation is well known to be challenging and is generally incompatible with industrial project management. The French “Investissements d´Avenir” programme is funding an important programme based in Grenoble, France on nanoelectronic technological research. The technology programme covers in particular 3D integration, silicon photonics and distributed network technologies, supported by technological infrastructure including a Characterisation Platform. This platform will aim to enhance the effectiveness of the Grenoble-based neutron and synchrotron light source facilities for European micro and nano-technological research.
Keywords :
nanotechnology; production facilities; research and development; three-dimensional integrated circuits; 3D integration; Grenoble based neutron; advanced electronics characterisation; characterisation platform; distributed network technology; industrial project management; microtechnological research; microtechnology; nanoelectronic device; nanoelectronic technological research; nanotechnological research; nanotechnology; silicon photonics; synchrotron X-rays; synchrotron light source facility; technological infrastructure; technology programme covers; Silicon; Tin; advanced characterisation; nanotechnologies; neutron; synchrotron;
Conference_Titel :
Semiconductor Conference Dresden-Grenoble (ISCDG), 2012 International
Conference_Location :
Grenoble
Print_ISBN :
978-1-4673-1717-7
DOI :
10.1109/ISCDG.2012.6360013