High frequency characterization and modeling of single metallic nanowire

The feasibility of using metallic nanowires (NWs) for microwave interconnect application is very attractive. This paper presents RF characterizations of aluminum (Al) nanowires (NWs) up to 65 GHz. Coplanar waveguide (CPW) test structures integrating with NWs of different lengths are designed and fabricated. From the measured S-parameters, the frequency-dependent electrical properties of the NWs can be found. Equivalent-circuit modeling combined with ADS Momentum is used to simulate the CPW devices under test. After comparing the theoretical and measured values, new circuit elements are deduced. From which, contact impedance can be determined accurately. The test setup proposed is useful for determination the actual conductivity and contact impedance of any metallic NW over a wide range of frequencies.