• DocumentCode
    2321430
  • Title

    Detection and localization of cable faults by time and frequency domain measurements

  • Author

    Shi, Qinghai ; Troeltzsch, Uwe ; Kanoun, Olfa

  • Author_Institution
    Meas. & Sensor Technol., Chemnitz Univ. of Technol., Chemnitz, Germany
  • fYear
    2010
  • fDate
    27-30 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The localization of cable faults is very important for communication systems, power distribution systems and vehicles. Reflectometry methods are often used to detect and locate cable faults. A high-frequency signal is send down the cable. The reflected signal includes information about changes of cable impedance. With measurement of the time or phase delay the faults can be detected and located. These methods are used to detect open and short circuits. There are also techniques available for detecting frays, joints and other small anomalies. This paper describes and simulates different wire test methods that suitable for portable or in-situ test equipment and compares their advantages and disadvantages. The methods compared are the time domain reflectometry (TDR), time frequency domain reflectometry (TFDR) and frequency domain reflectometry (FDR).
  • Keywords
    cable testing; cables (electric); fault location; time measurement; time-domain reflectometry; time-frequency analysis; cable faults; frequency domain measurements; high-frequency signal; in-situ test equipment; time domain measurements; time domain reflectometry; time frequency domain reflectometry; wire test methods; Reflectometry; Cable faults detection and location; Frequency domain reflectometry (FDR); digital signal processing (DSP); time domain reflectometry (TDR); time frequency domain reflectometry (TFDR) and cable fault location;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Signals and Devices (SSD), 2010 7th International Multi-Conference on
  • Conference_Location
    Amman
  • Print_ISBN
    978-1-4244-7532-2
  • Type

    conf

  • DOI
    10.1109/SSD.2010.5585506
  • Filename
    5585506