DocumentCode
2321614
Title
Improvement of crystal quality of cubic GaN film using AlN/GaN ordered alloy on GaAs[100] by plasma assisted molecular beam epitaxy
Author
Kimura, R. ; Shigemori, A. ; Shike, J. ; Ohuchi, M. ; Ishida, K. ; Takahashi, Koichi
Author_Institution
Dept. of Media Sci., Teikyo Univ. of Sci. & Technol., Yamanashi, Japan
fYear
2002
fDate
15-20 Sept. 2002
Firstpage
139
Lastpage
140
Abstract
Metastable cubic-GaN (c-GaN) is expected to have many advantages in physical properties over those of the hexagonal phase. Improvement of (AlN)/sub m/(GaN)/sub n/ ordered alloy was achieved by optimizing the nitridation conditions. (m and n represent the number of monolayers in each layer). The ordered alloy is used for uniform effective Al molar content control, which can be achieved by varying the ratio of each layer thickness. This process makes it is easy to maintain high quality stoichiometric growth for extended periods because all constituent layers are binary materials.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; molecular beam epitaxial growth; plasma deposition; semiconductor epitaxial layers; semiconductor growth; stoichiometry; Al molar content control; AlGaN; AlN-GaN; AlN/GaN ordered alloy buffer; GaAs; GaAs[100] substrate; GaN; PAMBE; c-GaN; crystal quality; layer thickness; metastable cubic phase; plasma assisted molecular beam epitaxy; stoichiometric growth; Artificial intelligence; Buffer layers; Gallium arsenide; Gallium nitride; Microcomputers; Phase measurement; Plasma sources; Plasma temperature; Substrates; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7581-5
Type
conf
DOI
10.1109/MBE.2002.1037798
Filename
1037798
Link To Document