• DocumentCode
    2321614
  • Title

    Improvement of crystal quality of cubic GaN film using AlN/GaN ordered alloy on GaAs[100] by plasma assisted molecular beam epitaxy

  • Author

    Kimura, R. ; Shigemori, A. ; Shike, J. ; Ohuchi, M. ; Ishida, K. ; Takahashi, Koichi

  • Author_Institution
    Dept. of Media Sci., Teikyo Univ. of Sci. & Technol., Yamanashi, Japan
  • fYear
    2002
  • fDate
    15-20 Sept. 2002
  • Firstpage
    139
  • Lastpage
    140
  • Abstract
    Metastable cubic-GaN (c-GaN) is expected to have many advantages in physical properties over those of the hexagonal phase. Improvement of (AlN)/sub m/(GaN)/sub n/ ordered alloy was achieved by optimizing the nitridation conditions. (m and n represent the number of monolayers in each layer). The ordered alloy is used for uniform effective Al molar content control, which can be achieved by varying the ratio of each layer thickness. This process makes it is easy to maintain high quality stoichiometric growth for extended periods because all constituent layers are binary materials.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; molecular beam epitaxial growth; plasma deposition; semiconductor epitaxial layers; semiconductor growth; stoichiometry; Al molar content control; AlGaN; AlN-GaN; AlN/GaN ordered alloy buffer; GaAs; GaAs[100] substrate; GaN; PAMBE; c-GaN; crystal quality; layer thickness; metastable cubic phase; plasma assisted molecular beam epitaxy; stoichiometric growth; Artificial intelligence; Buffer layers; Gallium arsenide; Gallium nitride; Microcomputers; Phase measurement; Plasma sources; Plasma temperature; Substrates; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Molecular Beam Epitaxy, 2002 International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7581-5
  • Type

    conf

  • DOI
    10.1109/MBE.2002.1037798
  • Filename
    1037798