Title :
Evaluation of monolithic and segmented thermoelectric materials by using a large-temperature-span apparatus
Author :
Kang, Y.S. ; Moriya, S. ; Kisara, K. ; Niino, M. ; Noda, Y. ; Chen, L. ; Sudo, T.
Author_Institution :
Kakuda Res. Center, Nat. Aerosp. Lab., Miyagi, Japan
Abstract :
In order to evaluate the thermoelectric properties and power output performance of a gradient TE material under a wide working temperature range, a large-temperature-span apparatus has been developed. However, an accurate evaluation is not so easy to put into practice on the gradient TE material because a lot of difficulties are associated with the heat flow control and the reducing of electrical resistance in the measurement circuit. The present work is a practice to characterize monolithic and segmented thermoelectric materials by the new developed apparatus and approach the method to evaluate a gradient TE material accurately and effectively. This work was carried out for the evaluation of a stacked monolithic (SiGe, PbTe and Bi2Te 3) TE leg and a segmented thermoelectric branch (PbTe/Bi2Te3), and we confirm their thermoelectromotive force, electrical resistance and temperature distribution both for the apparatus and for specimen stacks. We also made a trial power output evaluation using an electronic load and explore some technical problems in the evaluation of TE materials under a large temperature span. The results of evaluation on power output by electronic load indicate much lower value than the calculation using the real electrical resistance in TE materials. We discuss some problems for the evaluation of stacked thermoelectric materials under a large temperature difference condition
Keywords :
Ge-Si alloys; IV-VI semiconductors; bismuth compounds; electrical resistivity; lead compounds; semiconductor materials; thermoelectric conversion; thermoelectric power; Bi2Te3; PbTe; PbTe/Bi2Te3; SiGe; electrical resistance; electronic load; gradient TE material; heat flow; large temperature difference condition; large-temperature-span apparatus; monolithic thermoelectric materials; power output evaluation; power output performance; segmented thermoelectric branch; segmented thermoelectric materials; stacked monolithic TE leg; stacked thermoelectric materials; temperature distribution; thermoelectric properties; thermoelectromotive force; Bismuth; Electric resistance; Electric variables measurement; Electrical resistance measurement; Fluid flow measurement; Resistance heating; Tellurium; Temperature control; Temperature distribution; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
Conference_Location :
Dresden
Print_ISBN :
0-7803-4057-4
DOI :
10.1109/ICT.1997.667160