• DocumentCode
    2321832
  • Title

    Arsenic pressure dependence of surface migration length of As/sub 4/ molecules during molecular beam epitaxy of GaAsP on [411]A GaAs substrate

  • Author

    Higuchi, Yuji ; Uemura, M. ; Tatsuoka, Y. ; Kitada, T. ; Shimomura, Shoji ; Hiyamizu, S.

  • Author_Institution
    Dept. of Phys. Sci., Osaka Univ., Japan
  • fYear
    2002
  • fDate
    15-20 Sept. 2002
  • Firstpage
    163
  • Lastpage
    164
  • Abstract
    Summary form only given. The study of the surface migration length of As/sub 4/ molecules during molecular beam epitaxy (MBE) of GaAs under various growth conditions is very important to understand the growth mechanism of MBE. Recently, we reported that the surface migration length of As/sub 4/ molecules strongly depends on the substrate orientation and is much longer (10 /spl sim/ 30 /spl mu/m) than that of Ga atoms (/spl cong/ 1 /spl mu/m) (Tatsuoka et al. (2000; 2001)). The migration length of As/sub 4/ molecules on the [411]A substrate, /spl lambda//sub [411]A/, changes as exp(-Ea/k/sub B/T) with a small activation energy of Ea = 0.2 eV. In this work, we investigated the arsenic pressure dependence of /spl lambda//sub [411]A/ for the first time, and found that /spl lambda//sub [411]A/ is strongly dependent on the arsenic (As/sub 4/) pressure (P/sub As4/).
  • Keywords
    III-V semiconductors; arsenic; gallium arsenide; molecular beam epitaxial growth; semiconductor growth; semiconductor thin films; surface diffusion; 0.2 eV; 1 micron; 10 to 30 micron; As/sub 4/; As/sub 4/ molecules; GaAs; GaAsP; MBE; [411]A GaAs substrate; activation energy; arsenic pressure dependence; growth mechanism; molecular beam epitaxy; surface migration length; Ambient intelligence; Atomic layer deposition; Delta modulation; Dispersion; Electronics packaging; Energy resolution; Equations; Gallium arsenide; Molecular beam epitaxial growth;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Molecular Beam Epitaxy, 2002 International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7581-5
  • Type

    conf

  • DOI
    10.1109/MBE.2002.1037810
  • Filename
    1037810