• DocumentCode
    2321920
  • Title

    Development of distributed on-line monitoring system for dielectric loss tangent of high voltage capacitive apparatus

  • Author

    Qiang, Gao ; Pinnan, Ding ; Yue, Han ; Baohong, Geng

  • Author_Institution
    Northeast Electr. Power Res. Inst., Shenyang
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    1179
  • Lastpage
    1182
  • Abstract
    This paper presents a distributed measuring system for on-line monitoring of dielectric loss factor tan delta, and capacitance of HV apparatus. The method employs the discrete Fourier transform (DFT) which is performed on the scaled down analog voltage and current signals obtained using digital signal processing (DSP) technology. The measuring unit of the on-line monitoring system takes a series of measures in the hardware circuit design to improve the effectiveness of the DFT algorithm. The lab test results of measuring unit show that the measuring unit has high precision of measurement based on the DFT method. Field tests at a regional substation to evaluate the insulation of two groups of 220 kV current transformer units using the developed system.
  • Keywords
    current transformers; dielectric loss measurement; discrete Fourier transforms; high-voltage techniques; power apparatus; signal processing; DFT algorithm; HV apparatus; analog voltage signals; current signals; current transformer units; dielectric loss factor; dielectric loss tangent; digital signal processing technology; discrete Fourier transform; distributed measuring system; distributed on-line monitoring system; hardware circuit design; high voltage capacitive apparatus; voltage 220 kV; Circuit testing; Design for testability; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Digital signal processing; Discrete Fourier transforms; Measurement units; Monitoring; Voltage; DSP on-line monitoring; Discrete Fourier Transform; dielectric loss factor; distributed measuring system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-1621-9
  • Electronic_ISBN
    978-1-4244-1622-6
  • Type

    conf

  • DOI
    10.1109/CMD.2008.4580498
  • Filename
    4580498