• DocumentCode
    2322052
  • Title

    Design and analysis of microstrip line rotman lenses

  • Author

    Lin, Tse-Yu ; Lee, Seung-Cheol ; Rotman, Ruth ; Green, Yehuda ; Israel, Yaniv ; Lee, Jin-Fa

  • Author_Institution
    Ohio State Univ., Columbus
  • fYear
    2007
  • fDate
    9-15 June 2007
  • Firstpage
    4425
  • Lastpage
    4428
  • Abstract
    We simulate and compare three different Rotman lenses, under the beam excitation from the outermost input port, with the help of FEM method. Preliminary results suggest that for a large lens, eta = 0.65 , with a scan angle of 45deg, the microstrip Rotman lens with the focal ratio suggested by [1], g = (l+alpha2)/2, has a better performance than other designs with smaller focal ratio when uniform amplitude and linear phase variation is desired. Detail investigations will be conducted to compare the pros and cons of each design.
  • Keywords
    field emission electron microscopy; lenses; microstrip lines; FEM method; Rotman lenses; beam excitation; linear phase variation; microstrip line; uniform amplitude; Delay effects; Electronics industry; Equations; Feeds; Finite element methods; Geometrical optics; Lenses; Microstrip; Optical design; Optical waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-0877-1
  • Electronic_ISBN
    978-1-4244-0878-8
  • Type

    conf

  • DOI
    10.1109/APS.2007.4396524
  • Filename
    4396524