DocumentCode
2322106
Title
Dynamic behavior of IREB in a collective ion acceleration experiment
Author
Fine ; Rhee
Author_Institution
Lab. for Plasma Res., Maryland Univ., College Park, MD, USA
fYear
1989
fDate
0-0 1989
Firstpage
83
Abstract
Summary Form only given, as follows. An experimental study of dynamic behavior of net current in conjunction with collective ion acceleration is reported. In the presence of neutral gas, the injected IREB is subject to charge and current neutralizations, resulting in a complicated time- and space-dependent beam distribution in the drift tube. To investigate the dynamic behavior of the current in the drift tube, typically a 0.5 MeV, 70-kA, 100-ns electron beam of 2.54-cm diameter is injected through a foil anode into a drift tube of 15-cm diameter. Reproducibility of experiment was improved by using a specially designed anode system with a foil changer that allowed the production of many shots of high-current electron beam without disturbing the vacuum condition. The peak value of net current increased up to that of diode current as the hydrogen gas pressure increased until it reached a critical value P/sub c/=50 mtorr. As the pressure increased beyond P/sub c/, the peak current dropped exponentially with a decay constant of approximately 1 torr. The current waveforms showed a few distinctive features that can be attributed to the time-dependent charge and current neutralizations of the beam.<>
Keywords
collective accelerators; ion accelerators; particle beam diagnostics; relativistic electron beam tubes; 0.5 MeV; 100 ns; 15 cm; 2.54 cm; 70 kA; IREB; collective ion acceleration; current neutralizations; decay constant; diode current; drift tube; dynamic behavior; foil anode; foil changer; gas pressure; net current; relativistic election beam; space-dependent beam; time-dependent beam; Induction accelerators; Ion accelerators; Particle beam measurements; Relativistic effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location
Buffalo, NY, USA
Type
conf
DOI
10.1109/PLASMA.1989.166080
Filename
166080
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