DocumentCode :
2322667
Title :
Generating Test Cases for Timed Systems from Controlled Natural Language Specifications
Author :
Schnelte, Matthias
Author_Institution :
Software Quality Lab., Univ. of Paderborn, Paderborn, Germany
fYear :
2009
fDate :
8-10 July 2009
Firstpage :
348
Lastpage :
353
Abstract :
Dynamic testing is still the most used quality assurance technique in the automotive industry. There is a need to automate the testing process as much as possible. In this work we focus on the automatic generation of test cases from requirement specifications. To embed the approach as close as possible into existing workflows we start with natural language like specifications, as requirements are still mostly written in natural language. To support this, we specify a controlled natural language for the automotive domain. After acquiring the requirements they are translated into a formal model. The model enables an efficient reachability analysis and allows to describe rich temporal behavior. We then use partial order planning to create positive and negative tests. The resulting test cases are able to handle non-deterministic timing behavior. Furthermore the test cases can be presented in a comprehensible way, so that the reader can validate them.
Keywords :
automatic test software; automobile industry; formal specification; natural languages; reachability analysis; automotive industry; controlled natural language specifications; dynamic testing; formal model; nondeterministic timing behavior; partial order planning; quality assurance technique; temporal behavior; test case generation; timed systems; Automatic control; Automatic generation control; Automatic testing; Automotive engineering; Control systems; Electrical equipment industry; Natural languages; Quality assurance; System testing; Vehicle dynamics; controlled natural language; planning; test case generation; timed systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Secure Software Integration and Reliability Improvement, 2009. SSIRI 2009. Third IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3758-0
Type :
conf
DOI :
10.1109/SSIRI.2009.58
Filename :
5325349
Link To Document :
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