DocumentCode :
2322730
Title :
Improving Test Quality by a Test Type Analysis Based Method
Author :
Liu, Qin ; Zheng, Wenqiang ; Ma, JunFei
Author_Institution :
Sch. of Software Eng., Tongji Univ., Shanghai, China
fYear :
2009
fDate :
8-10 July 2009
Firstpage :
325
Lastpage :
328
Abstract :
This paper describes an easy adapted method of improving test coverage and effectiveness in an on-going industrial project by introducing and applying ´test type´ into test case design and execution. It presents comparison results of the number of system test item, effectiveness of test cases, and defect detection percentage between two increments in a real-world telecom project. It argues the importance of carrying out a test type analysis approach for test design, and proved a better test effectiveness (improved 5%) and DDP (improved 14%) can be performed by implementing the proposed approach. There was only a slightly increase of the budget after adapting the approach.
Keywords :
program testing; DDP; critical industry applications; industrial project; real-world telecom project; test effectiveness; test quality; test type analysis; Design methodology; ISO standards; Information analysis; Risk analysis; Robust stability; Software quality; Software testing; Switches; System testing; Usability; Test Type; Test analysis method; Test effectiveness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Secure Software Integration and Reliability Improvement, 2009. SSIRI 2009. Third IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3758-0
Type :
conf
DOI :
10.1109/SSIRI.2009.65
Filename :
5325353
Link To Document :
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