DocumentCode
2322938
Title
Study on assessment model of event-type power disturbances
Author
Xiangning Xiao ; Shun Tao
Author_Institution
Key Lab. of Power Syst. Protection, North China Electr. Power Univ., Beijing
fYear
2008
fDate
Nov. 30 2008-Dec. 3 2008
Firstpage
101
Lastpage
104
Abstract
This paper discussed the characteristics of power disturbances, and then proposed new classifying method. Disturbances are classified into two main categories, ldquocontinuous typerdquo and ldquoevent typerdquo. Continuous type disturbances typically include voltage deviation, power frequency deviation, unbalance, flicker and harmonics. Event type disturbances (ETD) include voltage sags (including short duration interruptions), outages, and transients. Based on the classification of power disturbances and traditional distribution reliability indices (SAIDI, CAIDI, SAIFI, CAIFI, and ASAI), Voltage sag indices coordinate interruption events indices were proposed: 1) SASDI and CASDI, 2) SASFI and CASFI. The comprehensive index ASAI*, a corrected ASAI, was defined based on SAIDI and SASDI coordinate of the economic losses of customers impacted by event type disturbances. The assessment model of ETD was proposed. The model represents the defined indices, the calculating procedure, the phase aggregation, and the time aggregation, which are four basic factors to rightly assessment power quality. A case study was used to testify the comprehensive method was reasonable and feasible.
Keywords
power supply quality; power system faults; power system reliability; power system transients; ASAI; CASDI; CASFI; SASDI; SASFI; classifying method; distribution reliability index; economic loss; event type power disturbance; include voltage sag; power outage; power quality assessment; power system transient; short duration interruption; Frequency; Laboratories; Monitoring; Power quality; Power system harmonics; Power system modeling; Power system protection; Power system reliability; Power system transients; Voltage fluctuations;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
Conference_Location
Macao
Print_ISBN
978-1-4244-2341-5
Electronic_ISBN
978-1-4244-2342-2
Type
conf
DOI
10.1109/APCCAS.2008.4745970
Filename
4745970
Link To Document