• DocumentCode
    2322938
  • Title

    Study on assessment model of event-type power disturbances

  • Author

    Xiangning Xiao ; Shun Tao

  • Author_Institution
    Key Lab. of Power Syst. Protection, North China Electr. Power Univ., Beijing
  • fYear
    2008
  • fDate
    Nov. 30 2008-Dec. 3 2008
  • Firstpage
    101
  • Lastpage
    104
  • Abstract
    This paper discussed the characteristics of power disturbances, and then proposed new classifying method. Disturbances are classified into two main categories, ldquocontinuous typerdquo and ldquoevent typerdquo. Continuous type disturbances typically include voltage deviation, power frequency deviation, unbalance, flicker and harmonics. Event type disturbances (ETD) include voltage sags (including short duration interruptions), outages, and transients. Based on the classification of power disturbances and traditional distribution reliability indices (SAIDI, CAIDI, SAIFI, CAIFI, and ASAI), Voltage sag indices coordinate interruption events indices were proposed: 1) SASDI and CASDI, 2) SASFI and CASFI. The comprehensive index ASAI*, a corrected ASAI, was defined based on SAIDI and SASDI coordinate of the economic losses of customers impacted by event type disturbances. The assessment model of ETD was proposed. The model represents the defined indices, the calculating procedure, the phase aggregation, and the time aggregation, which are four basic factors to rightly assessment power quality. A case study was used to testify the comprehensive method was reasonable and feasible.
  • Keywords
    power supply quality; power system faults; power system reliability; power system transients; ASAI; CASDI; CASFI; SASDI; SASFI; classifying method; distribution reliability index; economic loss; event type power disturbance; include voltage sag; power outage; power quality assessment; power system transient; short duration interruption; Frequency; Laboratories; Monitoring; Power quality; Power system harmonics; Power system modeling; Power system protection; Power system reliability; Power system transients; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
  • Conference_Location
    Macao
  • Print_ISBN
    978-1-4244-2341-5
  • Electronic_ISBN
    978-1-4244-2342-2
  • Type

    conf

  • DOI
    10.1109/APCCAS.2008.4745970
  • Filename
    4745970