• DocumentCode
    2322998
  • Title

    Complete analysis and performance-characteristic compromise for self-excited half-bridge parallel resonant electronic ballasts

  • Author

    Wu, T.-F. ; Yu, T.-H. ; Huang, H.M.

  • Author_Institution
    Power Electron. Appl. Res. Lab., Nat. Chung Cheng Univ., Chia-I, Taiwan
  • fYear
    1994
  • fDate
    20-25 Jun 1994
  • Firstpage
    124
  • Abstract
    This paper presents the complete circuit analysis and performance characteristic compromise for self excited half-bridge parallel resonant electronic ballasts. The operational principles of the ballasts taking parasitic devices into account are described in detail from which the excitation frequency as well as the voltage and current stresses imposed on switching devices are calculated. The design procedure, consequently, can be outlined to determine the component values so the lamp starting voltage, crest factor, cathode fall and component stresses are minimized. In addition, the effects of partial lamp removal during steady state operation and start-up transients are taken into account in the system design. Experimental results are used to verify the theoretical discussion
  • Keywords
    bridge circuits; energy conservation; lamp accessories; lamps; light sources; network analysis; power consumption; power convertors; switching circuits; cathode fall; circuit analysis; component stresses; component values; crest factor; current stresses; design procedure; energy efficiency; excitation frequency; lamp starting voltage; parasitic devices; partial lamp removal; performance characteristic; power convertors; self-excited half-bridge parallel resonant electronic ballasts; start-up transients; steady state operation; switching devices; voltage stresses; Cathodes; Circuit analysis; Electronic ballasts; Frequency; Lamps; Performance analysis; Resonance; Steady-state; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, PESC '94 Record., 25th Annual IEEE
  • Conference_Location
    Taipei
  • Print_ISBN
    0-7803-1859-5
  • Type

    conf

  • DOI
    10.1109/PESC.1994.349740
  • Filename
    349740