Title :
One model of profile function for X-ray scattering in thin films
Author_Institution :
Dept. of Comput. Phys., St. Petersburg Univ.
Abstract :
The study of crystalline thin films is of great interest. The characteristics of thin films are found in experiments on high intensity X-ray diffraction. These X-rays beams are produced by modern synchrotrons. It is usually assumed that the ordered part of the crystalline structure in a thin film is described by a profile function y(z), here z is the variable perpendicular to the film
Keywords :
X-ray crystallography; thin films; X-ray scattering; X-rays beams; crystalline structure; high intensity X-ray diffraction; profile function model; synchrotrons; thin films; Crystallization; Eigenvalues and eigenfunctions; Equations; Fourier transforms; Inverse problems; Physics computing; Synchrotrons; Transistors; X-ray diffraction; X-ray scattering;
Conference_Titel :
Day on Diffraction 2001. Proceedings. International Seminar
Conference_Location :
St.Petersburg
Print_ISBN :
5-7997-0366-9
DOI :
10.1109/DD.2001.988484
