• DocumentCode
    2324135
  • Title

    Design Of A Fault-Tolerant Microprocessor

  • Author

    Lee, Edward T. ; Lee, N.

  • Author_Institution
    Wayne State University
  • fYear
    1979
  • fDate
    4-7 Sep 1979
  • Firstpage
    100
  • Lastpage
    104
  • Keywords
    Circuit faults; Digital systems; Electronic switching systems; Fault detection; Fault diagnosis; Fault tolerance; Fault tolerant systems; Microprocessors; Redundancy; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compcon Fall 79. Proceedings
  • Type

    conf

  • DOI
    10.1109/CMPCON.1979.729090
  • Filename
    729090
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2324135