DocumentCode :
2324135
Title :
Design Of A Fault-Tolerant Microprocessor
Author :
Lee, Edward T. ; Lee, N.
Author_Institution :
Wayne State University
fYear :
1979
fDate :
4-7 Sep 1979
Firstpage :
100
Lastpage :
104
Keywords :
Circuit faults; Digital systems; Electronic switching systems; Fault detection; Fault diagnosis; Fault tolerance; Fault tolerant systems; Microprocessors; Redundancy; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compcon Fall 79. Proceedings
Type :
conf
DOI :
10.1109/CMPCON.1979.729090
Filename :
729090
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2324135
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