DocumentCode :
2324153
Title :
Microprocessor System Testing And Diagnostics
Author :
Davidson, R.P. ; Miller, N.R.
Author_Institution :
Bell Laboratories
fYear :
1979
fDate :
4-7 Sep 1979
Firstpage :
105
Lastpage :
110
Keywords :
Circuit testing; Computer architecture; Hardware; Large scale integration; Master-slave; Microprocessors; Monitoring; Software debugging; System testing; Washing machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compcon Fall 79. Proceedings
Type :
conf
DOI :
10.1109/CMPCON.1979.729091
Filename :
729091
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2324153
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