DocumentCode
2324153
Title
Microprocessor System Testing And Diagnostics
Author
Davidson, R.P. ; Miller, N.R.
Author_Institution
Bell Laboratories
fYear
1979
fDate
4-7 Sep 1979
Firstpage
105
Lastpage
110
Keywords
Circuit testing; Computer architecture; Hardware; Large scale integration; Master-slave; Microprocessors; Monitoring; Software debugging; System testing; Washing machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Compcon Fall 79. Proceedings
Type
conf
DOI
10.1109/CMPCON.1979.729091
Filename
729091
Link To Document