Title :
System level policies for fault tolerance issues in the FERMI project
Author :
Acqua, A. Dell´ ; Hansen, M. ; Ikinen, S. ; Lofstedt, B. ; Vanuxem, J.P. ; Svensson, C. ; Yuan, J. ; Hentzell, H. ; Buono, L. ; David, J. ; Genat, J.F. ; Lebbolo, H. ; LeDortz, O. ; Nayman, P. ; Savoy-Navarro, A. ; Zitoun, R. ; Alippi, C. ; Breveglieri, L
Author_Institution :
CERN, Geneva, Switzerland
Abstract :
The FERMI system, performing acquisition and DSP of calorimeter data in high energy collision experiments, planned at the LHC collider (CERN, Geneva, CH) is briefly overviewed. The system relies mainly upon the FERMI module, a dedicated VLSI multichip device performing most of the above functions, which is to be installed in large quantities (around 105) in the immediate neighborhood of the collider itself, requiring rad-hard features. The issues for a system which absolutely requires fault diagnosis and possibly fault tolerance are described, with regard to the FERMI module itself
Keywords :
digital signal processing chips; CERN; FERMI project; LHC collider; calorimeter data; dedicated VLSI multichip device; fault diagnosis; fault tolerance; high energy collision experiments; redundancy; testing; Digital signal processing; Fault diagnosis; Fault tolerant systems; Ionizing radiation; Large Hadron Collider; Materials science and technology; Microelectronics; Physics; Radiation hardening; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location :
Venice
Print_ISBN :
0-8186-3502-9
DOI :
10.1109/DFTVS.1993.595597