DocumentCode :
2324776
Title :
Terahertz optical activity and metamaterial properties of 2D array of metal-semiconductor microhelices
Author :
Kubarev, V.V. ; Prinz, V.Ya. ; Naumova, E.V. ; Golod, S.V.
Author_Institution :
Budker Inst. of Nucl. Phys., Novosibirsk, Russia
fYear :
2009
fDate :
21-25 Sept. 2009
Firstpage :
1
Lastpage :
2
Abstract :
The terahertz optical activity of 2D arrays of metal-semiconductor microhelices was investigated by Fourier spectroscopy and free electron laser methods. We found strong resonance at first harmonic with wavelength twice helix length and weaker resonances at the second and third harmonics. The resonances are present in the transmittance, reflectance, and absorption spectra. For linear polarized radiation, a chirality of the media leads to their ellipticity at resonance frequency and rotation of the polarization plane in opposite directions (up to 16.5 degrees) on both sides of the resonance. It has been shown by direct interferometric method on free electron laser that the refraction index of the investigated layer has negative values for definite circular wave at certain frequencies. Its minimal value is -0.11.
Keywords :
III-V semiconductors; chirality; free electron lasers; gallium arsenide; light transmission; metamaterials; optical rotation; reflectivity; refractive index; sodium; 2D array; Fourier spectroscopy; GaAs; Na-GaAs; absorption spectra; chirality; circular wave; direct interferometric method; free electron laser methods; linear polarized radiation; metal-semiconductor microhelices; metamaterial properties; reflectance spectra; refraction index; resonance frequency; terahertz optical activity; transmittance spectra; Electron optics; Free electron lasers; Metamaterials; Optical arrays; Optical interferometry; Optical refraction; Polarization; Reflectivity; Resonance; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
Type :
conf
DOI :
10.1109/ICIMW.2009.5325515
Filename :
5325515
Link To Document :
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