DocumentCode
2324776
Title
Terahertz optical activity and metamaterial properties of 2D array of metal-semiconductor microhelices
Author
Kubarev, V.V. ; Prinz, V.Ya. ; Naumova, E.V. ; Golod, S.V.
Author_Institution
Budker Inst. of Nucl. Phys., Novosibirsk, Russia
fYear
2009
fDate
21-25 Sept. 2009
Firstpage
1
Lastpage
2
Abstract
The terahertz optical activity of 2D arrays of metal-semiconductor microhelices was investigated by Fourier spectroscopy and free electron laser methods. We found strong resonance at first harmonic with wavelength twice helix length and weaker resonances at the second and third harmonics. The resonances are present in the transmittance, reflectance, and absorption spectra. For linear polarized radiation, a chirality of the media leads to their ellipticity at resonance frequency and rotation of the polarization plane in opposite directions (up to 16.5 degrees) on both sides of the resonance. It has been shown by direct interferometric method on free electron laser that the refraction index of the investigated layer has negative values for definite circular wave at certain frequencies. Its minimal value is -0.11.
Keywords
III-V semiconductors; chirality; free electron lasers; gallium arsenide; light transmission; metamaterials; optical rotation; reflectivity; refractive index; sodium; 2D array; Fourier spectroscopy; GaAs; Na-GaAs; absorption spectra; chirality; circular wave; direct interferometric method; free electron laser methods; linear polarized radiation; metal-semiconductor microhelices; metamaterial properties; reflectance spectra; refraction index; resonance frequency; terahertz optical activity; transmittance spectra; Electron optics; Free electron lasers; Metamaterials; Optical arrays; Optical interferometry; Optical refraction; Polarization; Reflectivity; Resonance; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location
Busan
Print_ISBN
978-1-4244-5416-7
Electronic_ISBN
978-1-4244-5417-4
Type
conf
DOI
10.1109/ICIMW.2009.5325515
Filename
5325515
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