Reproducibility of Microsecond Self-Breakdown Water Switch With Negative Field Enhancement

Author

Peitian Cong ; Guowei Zhang ; Liang Sheng ; Tieping Sun ; Hanyu Wu ; Zhengzhong Zeng ; Aici Qiu

Author_Institution

State Key Lab. of Intense Pulsed Radiat. Simulation & Effect, Northwest Inst. of Nucl. Technol., Xi´an, China

Volume

41

Issue

2

fYear

2013

fDate

Feb. 2013

Firstpage

355

Lastpage

359

Abstract

Based on the “QiangGuang-I” facility, three negatively enhanced microsecond water switches are experimentally studied, and their self-breakdown reproducibilities are particularly investigated and compared. Experimental results show that the annular-cathode-plate switch has a lower jitter (about 110 ns) and its lifespan can be up to 100 shots. Moreover, it is found that the close jitter decreases with the increase of negative field-enhancement factor f (the ratio of the maximum electric-field strength to the mean one of the anode-cathode gap). Finally, the experimental phenomena mentioned previously are particularly discussed according to the results of optical (3-5 ns gated charge-coupled device) and electrical diagnostics.

Keywords

cathodes; charge-coupled devices; jitter; pulsed power switches; QiangGuang-I facility; annular-cathode-plate switch; anode-cathode gap; electrical diagnostics; gated charge-coupled device; jitter; maximum electric-field strength; microsecond self-breakdown water switch; negative field-enhancement factor; negatively enhanced microsecond water switches; optical diagnostics; Cathodes; Educational institutions; Jitter; Optical switches; Streaming media; Close jitter; field enhancement; positive polarity; self-breakdown; water switches;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/TPS.2013.2238255

Filename

6417028