Title :
Frequency calibration of THz time-domain spectrometers using an etalon
Author :
Naftaly, Mira ; Dudley, Richard A. ; Fletcher, John R.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Abstract :
We present an etalon-based method of calibrating the frequency of THz time-domain spectrometers (TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air-gaps. The technique provides frequency calibration across the measurement band with uncertainties comparable with the typical THz TDS resolution.
Keywords :
calibration; electromagnetic wave interferometers; terahertz spectroscopy; etalon; frequency calibration; terahertz time domain spectrometer; Air gaps; Bandwidth; Calibration; Dynamic range; Frequency measurement; Optical reflection; Refractive index; Solids; Spectroscopy; Time domain analysis;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5325539
