Title :
A rule based inspection for printed circuit boards
Author :
Mital, Dinesh P. ; Khwang, Teoh Eam
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Abstract :
The authors present a method to recognize and identify various patterns in a scene. The technique utilizes standard design parameters available from reference parameters stored in the database, and it is composed of three main steps. The first consists of properly registering and identifying individual regions in the scene. Each region corresponds to a meaningful object or subobject. Once regions are properly identified, false alarms caused by slight rotation, translation or scaling can be avoided. The second step is to define rules for checking defects. A criterion that governs the appearance of different regions in the image is formed, and algorithms which are capable of verifying the test-parameters and detecting any violations are developed. In the third step, the processing algorithm proceeds by applying the decision criterion to each region in the image and detecting possible defects. Bridging and short-circuit faults for the printed boards are discussed
Keywords :
automatic optical inspection; computerised pattern recognition; electronic engineering computing; knowledge based systems; printed circuit testing; bridging faults; decision criterion; defect detection; object identification; pattern recognition; printed circuit boards; processing algorithm; reference parameters; rule based inspection; short-circuit faults; test-parameters; Circuit faults; Circuit testing; Design engineering; Electronic equipment testing; Image databases; Inspection; Knowledge engineering; Layout; Pattern recognition; Printed circuits;
Conference_Titel :
Computer and Communication Systems, 1990. IEEE TENCON'90., 1990 IEEE Region 10 Conference on
Print_ISBN :
0-87942-556-3
DOI :
10.1109/TENCON.1990.152710