Title :
TOF electron drift measurements in xenon difluoride (XeF/sub 2/) and hydrogen sulfide (H/sub 2/S) gas mixtures
Author :
Denman ; Schlie, L.A.
Author_Institution :
US Air Force Weapons Lab., Kirtland AFB, NM, USA
Abstract :
Summary Form only given, as follows. Sensitive, high-temporal-resolution, time-of-flight (TOF) drift measurements yielding the drift velocity, longitudinal diffusion, and a new, higher order diffusion coefficient have been obtained in the gases XeF/sub 2/ and H/sub 2/S. These gases are of interest because of their potential as lasing constituents when combined with the highly energetic (8.5 MJ/kg) hydrogen azide (HN/sub 3/) gas. Kinetic studies indicate that a hybrid electrochemical laser using a mixture of XeF/sub 2/ and HN/sub 3/ might produce high densities of XeF(B)B to X, 3511 AA by means of an electrically initiated chemical chain reaction. The determination of transport properties reveals information about electron/chemical kinetic pathways leading to laser emission. The temporal behavior of the electron current pulses, shows an asymmetrical skewness (seen also in the noble gases), which is well represented by extending the data analysis to the second-order diffusion approximation afforded by the density gradient expansion theory. This skewness is seen as a higher order diffusion phenomena being represented by the new diffusion coefficient. The highly sensitive current detection and temporal response of this drift tube have been made possible by combining the usual components found in TOF drift tubes with a very sensitive, fast current amplifier to resolve the electron current pulse.<>
Keywords :
diffusion in gases; electron mobility; hydrogen compounds; xenon compounds; B-X transition; H/sub 2/S; HN/sub 3/; XeF/sub 2/; asymmetrical skewness; density gradient expansion theory; drift velocity; electrically initiated chemical chain reaction; electron current pulse; electron current pulses; fast current amplifier; high-temporal-resolution; hybrid electrochemical laser; lasing constituents; longitudinal diffusion; noble gases; second-order diffusion approximation; time of flight electron drift measurement; transport properties; Charge carrier mobility; Diffusion processes; Hydrogen compounds; Xenon;
Conference_Titel :
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location :
Buffalo, NY, USA
DOI :
10.1109/PLASMA.1989.166099