DocumentCode :
2325812
Title :
Analysis of base transit time for a bipolar junction transistor considering base current
Author :
Chowdhury, Md Iqbal Bahar ; Hassan, M. M Shahidul
Author_Institution :
Dept. of Electr. & Electron. Eng., United Int. Univ., Dhaka, Bangladesh
fYear :
2010
fDate :
18-20 Dec. 2010
Firstpage :
20
Lastpage :
24
Abstract :
Consideration of base current makes the analytical modeling of base transit time for a bipolar junction transistor intractable, as such model requires knowledge of the majority hole current density, the recombination mechanism in the base and the injection of carriers from the base contact. All these effects along with bandgap narrowing, velocity saturation, Webster effect etc. makes the differential equation for minority carrier density third order or higher, nonlinear, non-homogeneous and of variable-coefficient. In this work, all these difficulties have been successfully overcome and therefore, an analytical model has been developed. The model results show that the consideration of base current increases the base transit time up to 5 - 8% even in the low-injection condition.
Keywords :
bipolar transistors; current density; differential equations; electron-hole recombination; hole density; minority carriers; semiconductor device models; transit time devices; Webster effect; bandgap narrowing; base current; base transit time analysis; bipolar junction transistor; carrier injection; differential equation; hole current density; minority carrier density; recombination mechanism; variable-coefficient; velocity saturation; Base transit time; lateral base injection; majority carrier current; recombination-generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering (ICECE), 2010 International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4244-6277-3
Type :
conf
DOI :
10.1109/ICELCE.2010.5700543
Filename :
5700543
Link To Document :
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