DocumentCode :
2326434
Title :
Base transit time of a Heterojunction Bipolar Transistor with Gaussian doped base
Author :
Islam, S. M Moududul ; Arafat, Yeasir ; Chowdhury, Iqbal Bahar ; Khan, M. Ziaur Rahman ; Hassan, M. M. Shahidul
Author_Institution :
Dept. of Electr. & Electron. Eng., United Int. Univ., Dhaka, Bangladesh
fYear :
2010
fDate :
18-20 Dec. 2010
Firstpage :
127
Lastpage :
130
Abstract :
Base transit time for an npn SiGe HBT is calculated assuming Gaussian doped base and a generalized trapezoidal Ge profile considering field dependent mobility in excess to doping dependent mobility and diffusivity. Band-gap narrowing (BGN) due to heavy doping, due to presence of Ge and due to change in the density of states (DOS) are also considered. For presence of Ge, a different saturation velocity has been used. Ge profile variation has been incorporated by a single parameter. Base transit time of SiGe HBT is calculated and computed for different Ge contents. The calculated base transit time shows similar variations as found in literature for BJT.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; semiconductor doping; Gaussian doped base; SiGe; bandgap narrowing; base transit time; density of states; doping dependent diffusivity; doping dependent mobility; field dependent mobility; generalized trapezoidal profile; heterojunction bipolar transistor; npn HBT; saturation velocity; Base transit time; Gaussian doping; HBT; bandgap narrowing; density of states; velocity saturation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering (ICECE), 2010 International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4244-6277-3
Type :
conf
DOI :
10.1109/ICELCE.2010.5700643
Filename :
5700643
Link To Document :
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