Ellipsometry in the terahertz range for liquid identification

Author

Dobroiu, Adrian ; Otani, Chiko

Author_Institution

Terahertz Sensing & Imaging Lab., RIKEN, Sendai, Japan

fYear

2009

fDate

21-25 Sept. 2009

Firstpage

1

Lastpage

2

Abstract

We present a method to determine the optical constants of a liquid at a given frequency in the terahertz range, by using a backward-wave oscillator as a continuous-wave source and an ellipsometric measurement setup consisting of two wire-grid polarizers. The liquid sample is placed on the total internal reflection surface of a silicon prism, thus changing the polarization state of the wave. By rotating the analyzer, useful information can be gathered about the optical properties of the liquid. We expect that this will ultimately allow the liquid identification or analysis.

Keywords

backward wave oscillators; ellipsometry; optical constants; optical polarisers; optical prisms; silicon; terahertz waves; Si; backward wave oscillator; continuous wave source; liquid identification; optical constants; prism; terahertz ellipsometry; total internal reflection; wire grid polarizers; Ellipsometry; Frequency measurement; Information analysis; Optical polarization; Optical reflection; Optical surface waves; Oscillators; Silicon; Submillimeter wave measurements; Surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on

Conference_Location

Busan

Print_ISBN

978-1-4244-5416-7

Electronic_ISBN

978-1-4244-5417-4

Type

conf

DOI

10.1109/ICIMW.2009.5325613

Filename

5325613