Title :
A toolbox for ASIC testability automation
Author_Institution :
VLSI Technol. Inc., San Jose, CA, USA
Abstract :
A set of tools that help the ASIC designer add testability to a circuit is described. The tools include the LFSR and BISTRAM compilers which generate a circuit for built-in self-test (BIST) and the VLSI test assistant which automatically adds testability logic to ASICs. The test assistant is currently being extended to support the automatic insertion of boundary scan into a chip and additional BIST compilers are under development
Keywords :
VLSI; application specific integrated circuits; built-in self test; integrated circuit testing; logic testing; program compilers; software tools; ASIC testability automation; BISTRAM; LFSR; VLSI test assistant; automatic insertion; boundary scan; built-in self-test; compilers; testability; testability logic; Application specific integrated circuits; Automatic testing; Automation; Built-in self-test; Circuit testing; Flip-flops; Logic testing; Pattern analysis; System testing; Very large scale integration;
Conference_Titel :
Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990
Conference_Location :
Boston, MA
DOI :
10.1109/CICC.1990.124818
