• DocumentCode
    2326970
  • Title

    PEST-a tool for implementing pseudo-exhaustive self test

  • Author

    Wu, Eleanor

  • Author_Institution
    AT&T Bell Lab., Princeton, NJ, USA
  • fYear
    1990
  • fDate
    13-16 May 1990
  • Abstract
    Pseudo-exhaustive self-test (PEST) is a built-in self-test (BIST) methodology. This methodology guarantees 100% stuck-at fault coverage without fault simulation or test generation. PEST is a software tool developed to implement pseudo-exhaustive self-test. PEST has been used in two chip designs. This work briefly describes the pseudo-exhaustive self-test methodology and its implementation in the PEST software tool. Comparative advantages of pseudo-exhaustive self-test over other BIST methodologies are discussed. Before concluding with a short user guide, some facts about the tool are presented and reference given
  • Keywords
    built-in self test; fault location; integrated circuit testing; logic testing; software tools; PEST; built-in self-test; chip designs; fault simulation; pseudo-exhaustive self test; software tool; stuck-at fault coverage; user guide; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit testing; Logic; Sequential analysis; Software testing; Software tools; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990
  • Conference_Location
    Boston, MA
  • Type

    conf

  • DOI
    10.1109/CICC.1990.124821
  • Filename
    124821