• DocumentCode
    232727
  • Title

    Effects of manufacturing limitations upon coplanar waveguide designs at high microwave frequencies

  • Author

    Anderson, C. ; Henderson, Robert ; Aroor, S.

  • Author_Institution
    Univ. of Texas at Dallas, Richardson, TX, USA
  • fYear
    2014
  • fDate
    3-4 April 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    To date, the effect of dimensional errors using standard printed circuit board etch processes on the transmission line (TL) response at mm-wave frequencies has not been investigated. While sidewall curvature due to etch has a negligible effect upon transmission line characteristics when the dimensions are in units of mm - these dimensional errors can become significant at higher GHz frequencies where dimensions are 10s of micrometers to achieve a 50 Ohm line impedance. These various geometric errors are studied in terms of the broadband microwave and mm-wave response on coplanar waveguide (CPW) transmission lines.
  • Keywords
    coplanar waveguides; electronic equipment manufacture; high-frequency transmission lines; CPW transmission lines; TL response; broadband microwave response; coplanar waveguide transmission lines; dimensional errors; geometric errors; mm-wave frequencies; mm-wave response; resistance 50 ohm; sidewall curvature; standard printed circuit board etch processes; transmission line characteristics; transmission line response; Coplanar waveguides; Copper; Impedance; Integrated circuit modeling; Manufacturing; Surface treatment; Transmission line measurements; Electronic equipment manufacture; Microwave propagation; Millimeter wave propagation; etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless and Microwave Circuits and Systems (WMCS), 2014 Texas Symposium on
  • Conference_Location
    Waco, TX
  • Type

    conf

  • DOI
    10.1109/WMCaS.2014.7015871
  • Filename
    7015871