Title :
Generation of Future image frames using Adaptive Network Based Fuzzy Inference System on spatiotemporal framework
Author :
Verma, Nishchal K. ; Shimaila
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India
Abstract :
This paper presents an algorithm for Future image frames generation using Adaptive Network Based Fuzzy Inference System (ANFIS) on spatiotemporal framework. The input to the network is a hyper-dimensional color and spatiotemporal feature of a pixel in an image sequence. The ANFIS is trained for R, G and B values separately for each and every pixel in image frame. Principal Component Analysis, Interaction Information and Bhattacharyya Distance measure have been used to reduce the dimensionality of the feature set. The resulting scheme has successfully been applied on satellite image sequence of a tropical cyclone. Two image quality assessment techniques, Canny edge detection based Image Comparison Metric (CIM) and Mean Structural Similarity Index Measure (MSSIM) have been used to evaluate future image frames quality. The proposed approach is found to have generated nine future image frames successfully.
Keywords :
artificial satellites; atmospheric movements; edge detection; fuzzy reasoning; geophysical image processing; image colour analysis; image sequences; principal component analysis; spatiotemporal phenomena; ANFIS training; Bhattacharyya distance measure; CIM; Canny edge detection based image comparison metric; MSSIM; adaptive network based fuzzy inference system; dimensionality reduction; feature set; future image frame generation; hyperdimensional color; image quality assessment techniques; image sequence; interaction information; mean structural similarity index measure; principal component analysis; satellite image sequence; spatiotemporal feature; spatiotemporal framework; tropical cyclone; Adaptive Network Based Fuzzy Inference System; Future Image Frames; Spatiotemporal;
Conference_Titel :
Applied Imagery Pattern Recognition Workshop (AIPR), 2012 IEEE
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-4558-3
DOI :
10.1109/AIPR.2012.6528197