Title :
A STAR GEM device for accurate transmittance measurements at an oblique angle of incidence
Author_Institution :
Nanoelectron. Res. Inst., AIST, Tsukuba, Japan
Abstract :
A few problems are discussed in transmittance measurements at an oblique angle of incidence. Incident angle dependence on transmittance of a 10 mm thick sample of silicon dioxide was measured by four kinds of experimental setups. Each measured transmittance was compared with theoretical one. The most reliable means of solving is that beams are directed to a detector by automatic adjusting of an angle of a mirror between the sample and the detector. This idea has been realized in a STAR GEM device.
Keywords :
mirrors; optical sensors; reflectivity; refractive index; refractive index measurement; silicon compounds; STAR GEM device; geminated ellipsoid mirror; oblique angle of incidence; silicon dioxide; transmittance measurements; Detectors; Ellipsoids; Mirrors; Optical attenuators; Optical refraction; Optical scattering; Photovoltaic cells; Reflectivity; Silicon compounds; Thickness measurement;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5325716
