Title :
An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyser
Author :
Van Moer, W. ; Rolain, Y. ; Schoukens, J.
Author_Institution :
Dept. ELEC/TW, Vrije Univ., Brussels, Belgium
Abstract :
This paper presents a method to automatically select the significant harmonics in spectra measured with the nonlinear vectorial network analyser. This stochastic selection criterion is based on the t/sup 2/-distribution. The method allows one to save and calibrate all and only significant spectral components, without the need for wild guessing the number of significant harmonics in the measured data.
Keywords :
Calibration; Harmonics; Network analysers; Stochastic processes; automatic harmonic selection scheme; calibration; nonlinear VNA; stochastic selection criterion; t/sup 2/-distribution; vector network analyser; Calibration; Feature extraction; Frequency; Gaussian noise; Harmonic analysis; Noise measurement; Nonlinear systems; Stochastic processes; Stochastic resonance; Testing;
Conference_Titel :
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5687-X
DOI :
10.1109/MWSYM.2000.862342