Title :
Thickness measurement of thin dielectric film using metallic mesh
Author :
Kato, E. ; Yoshida, S. ; Suizu, K. ; Kawase, K.
Author_Institution :
Nagoya Univ., Nagoya, Japan
Abstract :
Metallic mesh, a metallic thin film with regularly spaced openings, acts as a band-pass filter in the terahertz region. In a certain spectral range, its transmittance becomes higher than the open-area ratio and its resonant transmission spectrum is affected by the dielectric constant in and above the openings. Therefore, metallic mesh can be used as a sensitivity-enhancing material if samples are placed on the metal surface. Here, we report the measurement of thickness at a resolution of 1 mum for thin dielectric films and two-dimensional (2D) imaging using metallic mesh.
Keywords :
band-pass filters; dielectric thin films; metallic thin films; permittivity; terahertz wave spectra; thickness measurement; band-pass filter; dielectric constant; metallic mesh; open-area ratio; resonant transmission spectrum; sensitivity-enhancing material; terahertz filter; thickness measurement; thin dielectric film; transmittance; two-dimensional imaging; Band pass filters; Dielectric constant; Dielectric films; Dielectric materials; Dielectric measurements; Dielectric thin films; Image resolution; Inorganic materials; Resonance; Thickness measurement;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5325728